KSI－Nano型高分辨率表層缺陷超聲波掃描顯微鏡系統聲學顯微成像系統和光學顯微成像系統的完美結合
KSI Nano型超聲波掃描顯微鏡是擁有高分辨率的聲學顯微成像系統，它能對實測器件的表層缺陷作超高分辨缺陷檢測。
在使用100MHz——2000MHz的超高頻超聲波時，這種分辨率得以實現。
KSI nano 還包含***個倒置光學顯微鏡，在進行超聲波檢測前可利用它調整樣品的位置。
KSI nano超聲波掃描顯微鏡系統還應用于世界各地的生命和物質科學研究。
- 換能器頻率范圍：100MHz——2000MHz頻率實現高分辨率
- 探測深度<100nm
- 特殊平均模式使信噪比更好
- 同步光學成像和超聲波成像使樣品在結構上、生物化學性能上和機械性能上具有關聯性。
- 光聲效應增強了對比性
- 放大倍數：1000倍
- 入射光顯微鏡和倒置光學顯微鏡可調節
Ksi-nano high resolution surface defect ultrasonic scanning microscope system
The perfect combination of acoustic microimaging system ａnd optical microimaging system
The KSI Nano ultrasonic scanning microscope is a high resolution acoustic microimaging system, which can detect the surface surface defects of the device.
This resolution is achieved using uhf ultrasound at 100MHz －－ 2000MHz.
The KSI nano also includes an inverted optical microscope that can be used to position the sample before conducting ultrasonic testing.
The KSI nano ultrasonic scanning microscope system is also used in life ａnd matter science research around the world.
- transducer frequency range: 100MHz －－ 2000MHz for high resolution
- detection depth <100nm
- special average mode makes SNR better
- synchronous optical imaging ａnd ultrasonic imaging enable the structural, biochemical ａnd mechanical properties of the samples to be correlated.
- photoacoustic effects enhance contrast
- maximum magnification: 1000 x
- adjustable incident light microscope ａnd inverted optical microscope
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